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Patent
CN119019370A
39 compounds67 activity records2 assays
Patent summary
Activity compounds and values
Activity records
| Structure | Control | Value | Concentration | Time | Record ID | Compound | Assay | Details | ||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
 | % Degradation | - | = | 98.9 | % | 2 uM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A013407 | PGDB_C001492 | PGDB_AS000778 | View |
 | % Degradation | - | = | 11 | % | 2 uM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A013456 | PGDB_C001485 | PGDB_AS000778 | View |
 | % Degradation | - | = | 11.9 | % | 200 nM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A013784 | PGDB_C001486 | PGDB_AS001403 | View |
 | % Degradation | - | = | 56.6 | % | 2 uM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A013918 | PGDB_C001507 | PGDB_AS000778 | View |
 | % Degradation | - | = | 66.2 | % | 200 nM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A013940 | PGDB_C001518 | PGDB_AS001403 | View |
 | % Degradation | - | = | 51.6 | % | 2 uM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A014006 | PGDB_C001502 | PGDB_AS000778 | View |
 | % Degradation | - | = | 81.2 | % | 200 nM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A014727 | PGDB_C001520 | PGDB_AS001403 | View |
 | % Degradation | - | = | 68.3 | % | 200 nM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A015758 | PGDB_C001499 | PGDB_AS001403 | View |
 | % Degradation | - | = | 85.9 | % | 200 nM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A016641 | PGDB_C001489 | PGDB_AS001403 | View |
 | % Degradation | - | = | 49.3 | % | 200 nM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A017525 | PGDB_C001503 | PGDB_AS001403 | View |
 | % Degradation | - | = | 72.1 | % | 2 uM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A021252 | PGDB_C001513 | PGDB_AS000778 | View |
 | % Degradation | - | = | 89.6 | % | 2 uM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A022454 | PGDB_C001516 | PGDB_AS000778 | View |
 | % Degradation | - | = | 87.1 | % | 2 uM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A022609 | PGDB_C001490 | PGDB_AS000778 | View |
 | % Degradation | - | = | 90.6 | % | 2 uM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A026142 | PGDB_C001496 | PGDB_AS000778 | View |
 | % Degradation | - | = | 89.4 | % | 200 nM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A027135 | PGDB_C001510 | PGDB_AS001403 | View |
 | % Degradation | - | = | 64.3 | % | 200 nM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A027955 | PGDB_C001522 | PGDB_AS001403 | View |
 | % Degradation | - | = | 20.6 | % | 2 uM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A030046 | PGDB_C001487 | PGDB_AS000778 | View |
 | % Degradation | - | = | 67.7 | % | 200 nM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A030090 | PGDB_C001506 | PGDB_AS001403 | View |
 | % Degradation | - | = | 79.6 | % | 2 uM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A030216 | PGDB_C001491 | PGDB_AS000778 | View |
| % Degradation | - | = | 98.2 | % | 2 uM | 36 h | SIRT6 | - | SK-HEP-1 | PGDB_A030456 | PGDB_C001486 | PGDB_AS000778 | View |